A Framework for Service Convergence via Device Cooperation. - Seungchul Shin; Do-Yoon Kim; Sungyoung Yoon (HCI (6), 2009)

A Usability Evaluation of Public Icon Interface. - Sungyoung Yoon; Jonghoon Seo; Joonyoung Yoon; Seungchul Shin; Tack-Don Han (HCI (1), 2009)

Effects of Far-BEOL anneal on the WLR and product reliability characterization of FinFET process technology. - Hyun-Chul Sagong; Hyunjin Kim; Seungjin Choo; Sungyoung Yoon; Hyewon Shim; Sangsu Ha; Tae-Young Jeong; Minhyeok Choe; Junekyun Park; Sangchul Shin; Sangwoo Pae (IRPS, 2018)

Reliability of Industrial grade Embedded-STT-MRAM. - Yongsung Ji; Hyunjae Goo; Jungman Lim; Tae-Young Jeong; Taiki Uemura; Gun Rae Kim; Boil Seo; Seungbae Lee; Goeun Park; Jeongmin Jo; Sang-Il Han; Kilho Lee; et al. (IRPS, 2020)

Highly Reliable 28nm Embedded Flash Process Development for High-Density and High-Speed Automotive Grade-1 Application. - Jaehun Lee; Youngcheon Jeong; Kyongsik Yeom; Changmin Jeon; Jongsung Woo; Sangjin Lee; Ga-Young Lee; Dong-Hwee Hwang; Yong Seok Chung; Minji Seo; Dong-Hyun Kim; DalHwan Kim; et al. (IMW, 2021)