Detecting a Risk Signal in Stock Investment Through Opinion Mining and Graph-Based Semi-Supervised Learning. - Byungun Yoon; Yujin Jeong; Sunhye Kim (IEEE Access, 2020)

Patent infringement analysis using a text mining technique based on SAO structure. - Sunhye Kim; Byungun Yoon (Comput. Ind., 2021)

χ-separation: Magnetic susceptibility source separation toward iron and myelin mapping in the brain. - Hyeong-Geol Shin; Jingu Lee; Young Hyun Yun; Seong Ho Yoo; Jinhee Jang; Se-Hong Oh 001; Yoonho Nam; Sehoon Jung; Sunhye Kim; Masaki Fukunaga; Woojun Kim; Hyung Jin Choi; et al. (NeuroImage, 2021)

Technological Opportunities Discovery for Safety Through Topic Modeling and Opinion Mining in the Fourth Industrial Revolution: The Case of Artificial Intelligence. - Inchae Park; Byungun Yoon; Sunhye Kim; Hyeonju Seol (IEEE Trans. Engineering Management, 2021)

Multi-document summarization for patent documents based on generative adversarial network. - Sunhye Kim; Byungun Yoon (Expert Syst. Appl., 2022)

Doc2vec-based link prediction approach using SAO structures: application to patent network. - Byungun Yoon; Songhee Kim; Sunhye Kim; Hyeonju Seol (Scientometrics, 2022)

Impact Analysis of Telecommunications Technology Based on Usage Scenarios: The Case of 5G Low-Latency Technology in V2X. - Byungun Yoon; Hyejin Jang; Sunhye Kim; Youngkeun Song; Gwangman Park; Hyeonju Seol; Sungjoo Lee (IEEE Access, 2023)

Developing a data-driven technology roadmapping method using generative adversarial network (GAN). - Sunhye Kim; Hyejin Jang; Byungun Yoon (Comput. Ind., 2023)

Main path analysis for technological development using SAO structure and DEMATEL based on keyword causality. - Myeongji Oh; Hyejin Jang; Sunhye Kim; Byungun Yoon (Scientometrics, 2023)

An eXplainable AI (XAI) model for text-based patent novelty analysis. - Hyejin Jang; Sunhye Kim; Byungun Yoon (Expert Syst. Appl., 2023)

Developing Tech2Vec: A new embedding approach of technology information using a triple layer. - Suyeong Lee; Sunhye Kim; Daye Lee; Byungun Yoon (Comput. Ind. Eng., 2025)