ATTEST: Application-Agnostic Testing of a Novel Transistor-Level Programmable Fabric. - Mustafa Munawar Shihab; Bharath Ramanidharan; Suraag Sunil Tellakula; Gaurav Rajavendra Reddy; Jingxiang Tian; Carl Sechen; Yiorgos Makris (VTS, 2020)