Toward Security Closure in the Face of Reliability Effects ICCAD Special Session Paper. - Jens Lienig; Susann Rothe; Matthias Thiele; Nikhil Rangarajan; Mohammed Ashraf; Mohammed Nabeel 001; Hussam Amrouch; Ozgur Sinanoglu; Johann Knechtel (ICCAD, 2021)

Reliability by Design: Avoiding Migration-Induced Failure in IC Interconnects. - Susann Rothe; Jens Lienig (SBCCI, 2022)

Combined Modeling of Electromigration, Thermal and Stress Migration in AC Interconnect Lines. - Susann Rothe; Jens Lienig (ISPD, 2023)

Stress-based Electromigration Modeling in IC Design: Moving from Theory to Practice. - Susann Rothe; Jens Lienig; Sachin S. Sapatnekar (SMACD, 2024)