Test generation by activation and defect-drive (TEGAD). - Susumu Nitta; Masahiko Kawamura; Kanji Hirabayashi (Integr., 1985)

Probabilistic fault grading based on activation checking and observability analysis. - Masahisa Nakazawa; Susumu Nitta; Kanji Hirabayashi (J. Electron. Test., 1990)