Automated registration of low and high resolution atomic force microscopy images using scale invariant features. - Yun-feng Wang; Jason I. Kilpatrick; Suzanne P. Jarvis; Frank Boland; Anil C. Kokaram; David Corrigan (ICIP, 2014)

Double-Tip Artifact Removal From Atomic Force Microscopy Images. - Yun-feng Wang; Jason I. Kilpatrick; Suzanne P. Suzi Jarvis; Francis M. Boland; Anil C. Kokaram; David Corrigan (IEEE Trans. Image Process., 2016)