Offset measurement method for accurate characterization of BTI-induced degradation in opamps. - Swaraj Mahato; Pieter De Wit; Elie Maricau; Georges G. E. Gielen (ICECS, 2012)

Impact of transistor aging on RF low noise amplifier performance of 28nm technology: Reliability assessment. - Swaraj Mahato; Georges G. E. Gielen (ICECS, 2013)

A novel technique to characterize the spatial intra-pixel sensitivity variations in a CMOS image sensor. - Swaraj Mahato; J. De Ridder; Guy Meynants; Gert Raskin; Hans Van Winckel (NEWCAS, 2017)