Light Emission From Small Technologies. Are Silicon Based Detectors Reaching Their Limits? - Mustapha Remmach; Romain Desplats; Philippe Perdu; J. P. Roux; Michel Vallet; Sylvain Dudit; P. Sardin; Dean Lewis (Microelectron. Reliab., 2004)

Light Emission to Time Resolved Emission For IC Debug and Failure Analysis. - Mustapha Remmach; A. Pigozzi; Romain Desplats; Philippe Perdu; Dean Lewis; J. Noel; Sylvain Dudit (Microelectron. Reliab., 2005)

Impact and damage on deep sub-micron CMOS technology induced by substrate current due to ESD stress. - Philippe Galy; Sylvain Dudit; Michel Vallet; Corinne Richier; Christophe Entringer; Frank Jezequel; E. Petit; J. Beltritti (Microelectron. Reliab., 2009)

Facing the defect characterization and localization challenges of bridge defects on a submicronic technology (45 nm and below). - Guillaume Celi; Sylvain Dudit; Philippe Perdu; Antoine Reverdy; Thierry Parrassin; Emmanuel Bechet; Dean Lewis; Michel Vallet (Microelectron. Reliab., 2010)

Inventory of silicon signatures induced by CDM event on deep sub-micronic CMOS-BICMOS technologies. - Philippe Galy; Sylvain Dudit; Michel Vallet; Ph. Larre; M. Bilinski; E. Petit; J. Beltritti; A. Dray; Jean Jimenez; Frank Jezequel; R. Chevallier; C. Boutonnat; et al. (Microelectron. Reliab., 2010)

VLSI functional analysis by dynamic emission microscopy. - Philippe Perdu; Jerome Di-Battista; Sylvain Dudit; Tomonori Nakamura (Microelectron. Reliab., 2010)

Time Resolved Imaging: From logical states to events, a new and efficient pattern matching method for VLSI analysis. - Guillaume Bascoul; Philippe Perdu; A. Benigni; Sylvain Dudit; Guillaume Celi; Dean Lewis (Microelectron. Reliab., 2011)

LVI detection on passive structure in advance CMOS technology: New opportunities for device analysis. - Guillaume Celi; Sylvain Dudit; Thierry Parrassin; Philippe Perdu; Antoine Reverdy; Dean Lewis; Michel Vallet (Microelectron. Reliab., 2011)

Reliability impact due to high current, lattice and hot carriers temperatures on β(2×2) matrix ESD power devices for advanced CMOS technologies. - Philippe Galy; J. Bourgeat; Jean Jimenez; Blaise Jacquier; D. Marin-Cudraz; Sylvain Dudit (Microelectron. Reliab., 2011)

Failure analysis defect location on a real case 55 nm memory using dynamic power supply emulation. - Thierry Parrassin; Guillaume Celi; Sylvain Dudit; Michel Vallet (Microelectron. Reliab., 2011)