Low Power Test Compression with Programmable Broadcast-Based Control. - Sylwester Milewski; Grzegorz Mrugalski; Janusz Rajski; Jerzy Tyszer (ATS, 2014)

Full-scan LBIST with capture-per-cycle hybrid test points. - Sylwester Milewski; Nilanjan Mukherjee 001; Janusz Rajski; Jedrzej Solecki; Jerzy Tyszer; Justyna Zawada (ITC, 2017)

Hypercompression of Test Patterns. - Yu Huang 005; Sylwester Milewski; Janusz Rajski; Jerzy Tyszer; Chen Wang 014 (ITC, 2018)

Test Time and Area Optimized BrST Scheme for Automotive ICs. - Nilanjan Mukherjee 001; Jerzy Tyszer; Daniel Tille; Mahendar Sapati; Yingdi Liu; Jeffrey Mayer; Sylwester Milewski; Elham K. Moghaddam; Janusz Rajski; Jedrzej Solecki (ITC, 2019)

X-Tolerant Tunable Compactor for In-System Test. - Yingdi Liu; Sylwester Milewski; Grzegorz Mrugalski; Nilanjan Mukherjee 001; Janusz Rajski; Jerzy Tyszer; Bartosz Wldarczak (ITC, 2020)

Low Cost Hypercompression of Test Data. - Yu Huang 005; Sylwester Milewski; Janusz Rajski; Jerzy Tyszer; Chen Wang 014 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020)

On Reduction of Deterministic Test Pattern Sets. - Stephan Eggersglüß; Sylwester Milewski; Janusz Rajski; Jerzy Tyszer (ITC, 2021)

Autonomous Scan Patterns for Laser Voltage Imaging. - Wu-Tung Cheng; Sylwester Milewski; Grzegorz Mrugalski; Janusz Rajski; Maciej Trawka; Jerzy Tyszer (IEEE Trans. Emerg. Top. Comput., 2021)

X-Tolerant Compactor maXpress for In-System Test Applications With Observation Scan. - Yingdi Liu; Sylwester Milewski; Grzegorz Mrugalski; Nilanjan Mukherjee 001; Janusz Rajski; Jerzy Tyszer; Bartosz Wlodarczak (IEEE Trans. Very Large Scale Integr. Syst., 2021)

Time and Area Optimized Testing of Automotive ICs. - Nilanjan Mukherjee 001; Daniel Tille; Mahendar Sapati; Yingdi Liu; Jeffrey Mayer; Sylwester Milewski; Elham K. Moghaddam; Janusz Rajski; Jedrzej Solecki; Jerzy Tyszer (IEEE Trans. Very Large Scale Integr. Syst., 2021)

A New Static Compaction of Deterministic Test Sets. - Stephan Eggersglüß; Sylwester Milewski; Janusz Rajski; Jerzy Tyszer (IEEE Trans. Very Large Scale Integr. Syst., 2023)