Impact of Memory Voltage Scaling on Accuracy and Resilience of Deep Learning Based Edge Devices. - Benoît W. Denkinger; Flavio Ponzina; Soumya Basu 002; Andrea Bonetti; Szabolcs Balási; Martino Ruggiero; Miguel Peón-Quirós; Davide Rossi; Andreas Burg 001; David Atienza (IEEE Des. Test, 2020)

Dynamic Scheduling for Event-Driven Embedded Industrial Applications. - Hossein Taji; José Miranda; Miguel Peón-Quirós; Szabolcs Balási; David Atienza (VLSI-SoC, 2023)