Non-Adaptive Pattern Reordering to Improve Scan Chain Diagnostic Resolution. - Yu Huang 005; Jakub Janicki; Szczepan Urban (ETS, 2019)

Reversible Scan Based Diagnostic Patterns. - Yu Huang 005; Szczepan Urban; Wu-Tung Cheng; Manish Sharma; Fengju Niu; Junna Zhong; Wen-Lung Hsu (VLSI-DAT, 2019)

Scan Chain Diagnosis-Driven Test Response Compactor. - Jakub Janicki; Grzegorz Mrugalski; Artur Stelmach; Szczepan Urban (ATS, 2020)

Industry Evaluation of Reversible Scan Chain Diagnosis. - Soumya Mittal; Szczepan Urban; Kun Young Chung; Jakub Janicki; Wu-Tung Cheng; Martin Parley; Manish Sharma; Shaun Nicholson (ITC, 2022)

Predicting the Resolution of Scan Diagnosis. - Manoj Devendhiran; Jakub Janicki; Szczepan Urban; Manish Sharma; Jayant D'Souza (ITC, 2023)

Global Control Signal Defect Diagnosis in Volume Production Environment. - Szczepan Urban; Piotr Zimnowlodzki; Manish Sharma; Shraddha Bodhe; John Schulze; Abdullah Yassine; Adam Styblinski (ITC, 2023)

Adaptive Diagnosis Points for 100% Chain Diagnosis Coverage. - Wu-Tung Cheng; Manish Sharma; Xin Yang; Artur Stelmach; Szczepan Urban; Jakub Janicki; Preston McWithey (ITC, 2024)