A Low Noise Fault Tolerant Radiation Hardened 2.56 Gbps Clock-Data Recovery Circuit with High Speed Feed Forward Correction in 65 nm CMOS. - Jeffrey Prinzie; Szymon Kulis; Pedro Leitao; Rui Francisco; Valentijn De Smedt; Paulo Moreira; Paul Leroux (LASCAS, 2019)

A High-resolution, Wide-range, Radiation-hard Clock Phase-shifter in a 65 nm CMOS Technology. - Szymon Kulis; Dongxu Yang; Datao Ghong; Jose Fonseca; Stefan Biereigel; Jingbo Ye; Paulo Moreira (MIXDES, 2019)

A Low Noise Fault Tolerant Radiation Hardened 2.56 Gbps Clock-Data Recovery Circuit With High Speed Feed Forward Correction in 65 nm CMOS. - Stefan Biereigel; Szymon Kulis; Pedro Leitao; Rui Francisco; Paulo Moreira; Paul Leroux; Jeffrey Prinzie (IEEE Trans. Circuits Syst. I Fundam. Theory Appl., 2020)

Smart-Redundancy With In Memory ECC Checking: Low-Power SEE-Resistant FPGA Architectures. - Aurélien Alacchi; Edouard Giacomin; Roman Gauchi; Szymon Kulis; Pierre-Emmanuel Gaillardon (IEEE Trans. Very Large Scale Integr. Syst., 2023)

Intra and Inter-Device Reliabilities of the Instrumented Timed-Up and Go Test Using Smartphones in Young Adult Population. - Thâmela Thaís Santos dos Santos; Amélia Pasqual Marques; Luis Carlos Pereira Monteiro; Enzo Gabriel da Rocha Santos; Gustavo Henrique Lima Pinto; Anderson Belgamo; Anselmo de Athayde Costa e Silva; André dos Santos Cabral; Szymon Kulis; Jan Gajewski; Givago Silva Souza; Tacyla Jesus da Silva; et al. (Sensors, 2024)

Silicon Photonics for Harsh Environments. - Daniele Alfiero; Sophie Baron; Mateusz Baszczyk; Stefan Biereigel; Stéphane Détraz; Adam Klekotko; Szymon Kulis; Francesco Martina; Paulo Moreira; Lauri Olanterä; Carmelo Scarcella; Christophe Sigaud; et al. (OFC, 2025)

Validity and Reliability of a Mobile Device Application for Assessing Motor Performance in the 30-Second Sit-to-Stand Test. - Eduardo Veloso Ferreira; Amélia Pasqual Marques; Szymon Kulis; Jan Gajewski; Anderson Antunes da Costa Moraes; Manuela Brito Duarte; Gizele Cristina da Silva Almeida; Enzo Gabriel da Rocha Santos; Gustavo Henrique Lima Pinto; André dos Santos Cabral; Givago Silva Souza; Anselmo de Athayde Costa e Silva; et al. (IEEE Access, 2025)