Design of Cover Circuits for Monitoring the Output of a MISA. - T. Bogue; Helmut Jürgensen; Michael Gössel (DFT, 1994)

BIST with negligible aliasing through random cover circuits. - T. Bogue; Helmut Jürgensen; Michael Gössel (ASP-DAC, 1995)

Built-In Self-Test with an Alternating Output. - T. Bogue; Michael Gössel; Helmut Jürgensen; Yervant Zorian (DATE, 1998)