Hierarchical defect-oriented fault simulation for digital circuits. - Mykola Blyzniuk; T. Cibáková; Elena Gramatová; Wieslaw Kuzmicz; M. Lobur; Witold A. Pleskacz; Jaan Raik; Raimund Ubar (ETW, 2000)

Internet-Based Collaborative Test Generation with MOSCITO. - André Schneider; Karl-Heinz Diener; Eero Ivask; Jaan Raik; Raimund Ubar; P. Miklos; T. Cibáková; Elena Gramatová (DATE, 2002)

Hierarchical test generation for combinational circuits with real defects coverage. - T. Cibáková; Mária Fischerová; Elena Gramatová; Wieslaw Kuzmicz; Witold A. Pleskacz; Jaan Raik; Raimund Ubar (Microelectron. Reliab., 2002)