Plug & Play IDDQ Monitoring with QTAG. - Keith Baker; T. F. Waayers; F. G. M. Bouwman; M. J. W. Verstraelen (ITC, 1995)

Testing and programming flash memories on assemblies during high volume production. - Frans G. M. de Jong; Alex S. Biewenga; D. C. L. (Erik) van Geest; T. F. Waayers (ITC, 2001)