Accelerated lifetime test of RF-MEMS switches under ESD stress. - Jinyu Jason Ruan; Nicolas Nolhier; George J. Papaioannou; David Trémouilles; Vincent Puyal; C. Villeneuve; T. Idda; Fabio Coccetti; Robert Plana (Microelectron. Reliab., 2009)

Life expectancy and characterization of capacitive RF MEMS switches. - Mohamed Matmat; K. Koukos; Fabio Coccetti; T. Idda; Antoine Marty; Christophe Escriba; Jean-Yves Fourniols; Daniel Estève (Microelectron. Reliab., 2010)