Saturation throughput analysis of WAVE networks in Doppler spread scenarios. - T. Luo; Z. Wen; J. Li; H.-H. Chen (IET Commun., 2010)

Characteristics of Ni/AlOx/Pt RRAM devices with various dielectric fabrication temperatures. - Zong Jie Shen; Chun Zhao; C. Z. Zhao; Ivona Z. Mitrovic; Li Yang; Wangying Xu; Eng Gee Lim; T. Luo; Y. B. Huang (ICICDT, 2019)