Application of defect injection flow for fault validation in memories. - K. Amirkhanyan; A. Davtyan; Gurgen Harutyunyan; T. Melkumyan; Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (EWDTS, 2013)

An efficient fault diagnosis and localization algorithm for Successive-Approximation Analog to Digital Converters. - T. Melkumyan; Gurgen Harutyunyan; Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (EWDTS, 2013)