Reliability Assessment of a-IGZO and ZnO Thin Film Transistors (TFTs) to X-ray irradiation. - Rodolfo A. Rodriguez-Davila; L. Fernandez-Izquierdo; J. Fink; T. Moise; Robert C. Baumann; B. Gnade; Manuel Quevedo-Lopez; Chadwin D. Young (IRPS, 2024)