Influence of voltage contacts on precision measurements of the quantized Hall resistance: an effect of externally injected current. - T. P. Chen; H. A. Chua (IEEE Trans. Instrum. Meas., 1998)

Reproducibility of transmission line measurement of bipolar I-V characteristics of MOSFETs. - T. P. Chen; R. Chan; S. Fung; K. F. Lo (IEEE Trans. Instrum. Meas., 1999)