The Complexity of Checkers on an N * N Board - Preliminary Report - Aviezri S. Fraenkel; M. R. Garey; David S. Johnson 001; T. Schaefer; Yaacov Yesha (FOCS, 1978)

Assessing intrinsic and extrinsic end-of-life risk using functional SRAM wafer level testing. - Yoann Mamy Randriamihaja; William McMahon; S. Balasubramanian; Tanya Nigam; Biju Parameshwaran; Randy W. Mann; Torsten Klick; T. Schaefer; A. Kumar; Y. Song; Vivek Joshi; Rakesh Ranjan; et al. (IRPS, 2015)