Testing of Sense Amplifier in Dynamic Memory. - T. Tada; T. Kobayashi; K. Okada; Y. Kuramitsu (ITC, 1982)

A fine pitch probe technology for VLSI wafer testing. - T. Tada; R. Takagi; S. Nakao; M. Hyozo; T. Arakawa; K. Sawada; M. Ueda (ITC, 1990)

A Variable Drivability (VD) Output Buffer for the System In a Package (SIP) and High Frequency Wafer Test. - Shigeki Tomishima; Hiroaki Tanizaki; Mitsutaka Niiro; Masanao Maruta; Hideto Hidaka; T. Tada; Kenji Gamo (ITC, 2002)

Measurement of force acting on surgical instrument for force-feedback to master robot console. - Shigeyuki Shimachi; Yoshihide Hakozaki; T. Tada; Yasunori Fujiwara (CARS, 2003)