Construction of a cost-effective failure analysis service network–microelectronic failure analysis service in Japan. - S. Nakajima; S. Nakamura; K. Kuji; T. Ueki; T. Ajioka; T. Sakai (Microelectron. Reliab., 2002)

Sample preparation techniques for physical analysis of VLSIs. - S. Nakajima; S. Nakamura; T. Ueki; T. Sakai (Microelectron. Reliab., 2004)