Study of a failure mechanism during UIS switching of planar PT-IGBT with current sense cell. - Giovanni Breglio; Andrea Irace; Ettore Napoli; Paolo Spirito; Kimimori Hamada; T. Nishijima; T. Ueta (Microelectron. Reliab., 2007)

Detection of localized UIS failure on IGBTs with the aid of lock-in thermography. - Giovanni Breglio; Andrea Irace; Ettore Napoli; Michele Riccio; Paolo Spirito; Kimimori Hamada; T. Nishijima; T. Ueta (Microelectron. Reliab., 2008)