Thermally-activated degradation of InGaN-based laser diodes: Effect on threshold current and forward voltage. - Carlo De Santi; Matteo Meneghini; Michael Marioli; Matteo Buffolo; Nicola Trivellin; T. Weig; K. Holc; K. Köhler; J. Wagner; U. T. Schwarz; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2014)