Highly reliable TaOx ReRAM with centralized filament for 28-nm embedded application. - Yukio Hayakawa; Atsushi Himeno; Ryutaro Yasuhara; W. Boullart; E. Vecchio; T. Vandeweyer; T. Witters; D. Crotti; M. Jurczak; S. Fujii; S. Ito; Y. Kawashima; et al. (VLSIC, 2015)