Large-scale atomistic approach to random-dopant-induced characteristic variability in nanoscale CMOS digital and high-frequency integrated circuits. - Yiming Li 005; Chih-Hong Hwang; Ta-Ching Yeh; Tien-Yeh Li (ICCAD, 2008)

Logic Process Compatible 40NM 16MB, Embedded Perpendicular-MRAM with Hybrid-Resistance Reference, Sub-μA Sensing Resolution, and 17.5NS Read Access Time. - Yi-Chun Shih; Chia-Fu Lee; Yen-An Chang; Po-Hao Lee; Hon-Jarn Lin; Yu-Lin Chen; Ku-Feng Lin; Ta-Ching Yeh; Hung-Chang Yu; Harry Chuang; Yu-Der Chih; Tsung-Yung Jonathan Chang (VLSI Circuits, 2018)

Logic Process Compatible 40-nm 16-Mb, Embedded Perpendicular-MRAM With Hybrid-Resistance Reference, Sub- $ mu$ A Sensing Resolution, and 17.5-nS Read Access Time. - Yi-Chun Shih; Chia-Fu Lee; Yen-An Chang; Po-Hao Lee; Hon-Jarn Lin; Yu-Lin Chen; Ku-Feng Lin; Ta-Ching Yeh; Hung-Chang Yu; Harry Chuang; Yu-Der Chih; Tsung-Yung Jonathan Chang (IEEE J. Solid State Circuits, 2019)