A Dynamic Huffman Coding Method for Reliable TLC NAND Flash Memory. - Chin-Hsien Wu; Hao-Wei Zhang; Chia-Wei Liu; Ta-Ching Yu; Chi-Yen Yang (ACM Trans. Design Autom. Electr. Syst., 2021)

CRRC: Coordinating Retention Errors, Read Disturb Errors and Huffman Coding on TLC NAND Flash Memory. - Ta-Ching Yu; Chin-Hsien Wu; Yan-Qi Liao (IEEE Trans. Dependable Secur. Comput., 2023)