Demonstration of High Endurance Capability on Mega-Bit RRAM Macro and Model of ppm Level Failures. - Chang-Feng Yang; Chun-Yu Wu; Meng-Chun Shih; Ming-Ta Yang; Ming-Han Yang; Yu-Tien Wu; Ta-Chun Chien; Chih-Wei Lai; Shih-Chi Tsai; Wen-Ting Chu; Arthur Hung (VLSI Technology and Circuits, 2022)