Hydrogen passivation effects under negative bias temperature instability stress in metal/silicon-oxide/silicon-nitride/silicon-oxide/silicon capacitors for flash memories. - Hee-Dong Kim; Ho-Myoung An; Yujeong Seo; Yongjie Zhang; Jongsun Park 001; Tae Geun Kim (Microelectron. Reliab., 2010)

Study of Alzheimer's Disease-Related Biophysical Kinetics with a Microslit-Embedded Cantilever Sensor in a Liquid Environment. - Myung-Sic Chae; Jinsik Kim; Yong Kyoung Yoo; Jeong Hoon Lee 002; Tae Geun Kim; Kyo Seon Hwang (Sensors, 2017)

High-Efficiency and High-Reliability Deep-UV Light-Emitting Diodes Using Transparent Ni-Implanted AlN Ohmic Electrodes. - Tae Hoon Park; Kyung Rock Son; Hideki Hirayama; Tae Geun Kim (IEEE Access, 2021)