Methodology for improvement of data retention in floating gate flash memory using leakage current estimation. - Pyung Moon; Jun Yeong Lim; Tae-Un Youn; Keum-Whan Noh; Sung-Kye Park; Ilgu Yun (Microelectron. Reliab., 2013)

Effect of electric field polarity on inter-poly dielectric during cell operation for the retention characteristics. - Pyung Moon; Jun Yeong Lim; Tae-Un Youn; Keum-Whan Noh; Ilgu Yun (Microelectron. Reliab., 2015)