SREL: Severity Rating Ensemble Learning for Non-Destructive Fault Diagnosis of Cu Interconnects using S-parameter Patterns. - Tae Yeob Kang; Haebom Lee; Sungho Suh (CoRR, 2023)

In situ Fault Diagnosis of Indium Tin Oxide Electrodes by Processing S-Parameter Patterns. - Tae Yeob Kang; Haebom Lee; Sungho Suh (CoRR, 2023)

Image Generation of Ultra-Thin Polymer Films Using Diffusion Models from Tensile Testing for Mechanical Failure Prediction. - Sungho Suh; Haebom Lee; Tae Yeob Kang (ICEIC, 2024)

Fault Diagnosis of Indium Tin Oxide Electrodes by Multi-channel S-parameter Patterns. - Sungho Suh; Haebom Lee; Tae Yeob Kang (ICEIC, 2024)

Non-Invasive Quantification of Corrosion in Cu Interconnects Using Regression Models With S-Parameters. - Tae Yeob Kang; Seunghyeok Hong (IEEE Access, 2025)