On-Chip Capacitors with Wall-Type Structure in 9th Generation 3D VNAND Flash Memory. - Taegon Lee; Ji-Eun Ha; Kang-In Lee; Jung-Hwan Lee; Hyung-Geun Yook; In-Chul Shin; Jang-Hwan Jeong; Minkyu Kang; Joonsung Lim; Kyungyoon Noh; Seungwan Hong; Sunghoi Hur (IMW, 2025)

New Burnout Failure at the Chip Edge: Analysis and Preventive Design by a Novel Experimental Approach. - Seungmin Lee; Taegon Lee; Gaeun Kim; Kwang-Ryul Lee; Eunji An; Sekwon Hong; Sungjun Kim; Soonkwan Kang; Seokwoo Hong; Hwan Cha; Minkyu Kang; Jaesun Yun; et al. (IRPS, 2025)