Localization-Aware Adaptive Pairwise Margin Loss for Fine-Grained Image Recognition. - Taehung Kim; Hoseong Kim; Hyeran Byun (IEEE Access, 2021)

The feature generator of hard negative samples for fine-grained image recognition. - Taehung Kim; Kibeom Hong; Hyeran Byun (Neurocomputing, 2021)