A knowledge-based supervision model for machine tools. - Taehwan Yoon; José C. Príncipe (COMPSAC, 1989)

Machine Learning-Based Read Access Yield Estimation and Design Optimization for High-Density SRAM. - Taehwan Yoon; Hanwool Jeong (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2023)

High Efficiency Variation-Aware SRAM Timing Characterization via Machine-Learning-Assisted Netlist Extraction. - Inseong Jeon; Hyunho Park; Taehwan Yoon; Hanwool Jeong (IEEE Trans. Circuits Syst. II Express Briefs, 2024)

FedRef: Communication-Efficient Bayesian Fine Tuning with Reference Model. - Taehwan Yoon; Bongjun Choi (CoRR, 2025)