Novel, fast, edge-directed image reconstruction algorithm using a substepping system for critical-dimension measurement of glass panels. - Nam-Thai Doan; Jun-Hee Moon; Tai-Wook Kim; Heui-Jae Pahk (J. Electronic Imaging, 2012)

Real-time critical dimension measurement of thin film transistor liquid crystal display patterns using optical coherence tomography. - Sung-Hoon Park; Tai-Wook Kim; Jeong-Ho Lee; Heui-Jae Pahk (J. Electronic Imaging, 2014)