Relation between Reliability and Yield of IC's Based on Discrete Defect Distribution Model. - Tianxu Zhao; Yue Hao 001; Peijun Ma; Taifeng Chen (DFT, 2001)

Soft computing based smart grid fault detection using computerised data analysis with fuzzy machine learning model. - Taifeng Chen; Chunbo Liu (Sustain. Comput. Informatics Syst., 2024)