Test Pattern for Supply Current Test of Open Defects by Applying Time-Variable Electric Field. - Hiroyuki Yotsuyanagi; Masaki Hashizume; Taisuke Iwakiri; Masahiro Ichimiya; Takeomi Tamesada (DFT, 2001)

Random Pattern Testability of the Open Defect Detection Method using Application of Time-variable Electric Field. - Hiroyuki Yotsuyanagi; Masaki Hashizume; Taisuke Iwakiri; Masahiro Ichimiya; Takeomi Tamesada (DELTA, 2002)