Two-Tone Signal Generation for Communication Application ADC Testing. - Keisuke Kato; Fumitaka Abe; Kazuyuki Wakabayashi; Chuan Gao; Takafumi Yamada; Haruo Kobayashi 001; Osamu Kobayashi; Kiichi Niitsu (Asian Test Symposium, 2012)

Low-Distortion Sinewave Generation Method Using Arbitrary Waveform Generator. - Kazuyuki Wakabayashi; Keisuke Kato; Takafumi Yamada; Osamu Kobayashi; Haruo Kobayashi 001; Fumitaka Abe; Kiichi Niitsu (J. Electron. Test., 2012)

Two-Tone Signal Generation for ADC Testing. - Keisuke Kato; Fumitaka Abe; Kazuyuki Wakabayashi; Chuan Gao; Takafumi Yamada; Haruo Kobayashi 001; Osamu Kobayashi; Kiichi Niitsu (IEICE Trans. Electron., 2013)