VFSIM: Vectorized Fault Simulator Using a Reduction Technique Excluding Temporarily Unobservable Faults. - Takaharu Nagumo; Masahiko Nagai; Takao Nishida; Masayuki Miyoshi; Shunsuke Miyamoto (DAC, 1994)

A BIST approach for very deep sub-micron (VDSM) defects. - Yasuo Sato; Toyohito Ikeya; Michinobu Nakao; Takaharu Nagumo (ITC, 2000)

Test Generation for Multiple-Threshold Gate-Delay Fault Model. - Michinobu Nakao; Yoshikazu Kiyoshige; Kazumi Hatayama; Yasuo Sato; Takaharu Nagumo (Asian Test Symposium, 2001)

Application of High-Quality Built-In Test to Industrial Designs. - Kazumi Hatayama; Michinobu Nakao; Yoshikazu Kiyoshige; Koichiro Natsume; Yasuo Sato; Takaharu Nagumo (ITC, 2002)