Characterization of Trench MOS Gate Structures Utilizing Photon Emission Microscopy. - Masanori Usui; Takahide Sugiyama; Masayasu Ishiko; Jun Morimoto; Hirokazu Saitoh; Masaki Ajioka (Microelectron. Reliab., 2002)

Investigation of IGBT turn-on failure under high applied voltage operation. - Masayasu Ishiko; Koji Hotta; Sachiko Kawaji; Takahide Sugiyama; Tomoyuki Shouji; Takeshi Fukami; Kimimori Hamada (Microelectron. Reliab., 2004)

Design and modulation method of Multi-port DC/DC converter for next generation HV sub system. - Kenichi Itoh; Shuntaro Inoue; Takahide Sugiyama; Masaru Sugai (IECON, 2016)