An Optimal Time Expansion Model Based on Combinational ATPG for RT level Circuits. - Tomoo Inoue; Toshinori Hosokawa; Takahiro Mihara; Hideo Fujiwara (Asian Test Symposium, 1998)

Test Generation for Acyclic Sequential Circuits with Hold Registers. - Tomoo Inoue; Debesh Kumar Das; Chiiho Sano; Takahiro Mihara; Hideo Fujiwara (ICCAD, 2000)