An effective fault simulation method for core based LSI. - Takaki Yoshida; Reisuke Shimoda; Takashi Mizokawa; Katsuhiro Hirayama (Asian Test Symposium, 1997)

Practical Application of Automated Fault Diagnosis for Stuck-at, Bridging, and Measurement Condition Dependent Faults in Fully Scanned Sequential Circuits. - Reisuke Shimoda; Takaki Yoshida; Masafumi Watari; Yasuhiro Toyota; Kiyokazu Nishi; Akira Motohara (Asian Test Symposium, 1999)

MD-SCAN Method for Low Power Scan Testing. - Takaki Yoshida; Masafumi Watari (Asian Test Symposium, 2002)

A New Approach for Low Power Scan Testing. - Takaki Yoshida; Masafumi Watari (ITC, 2003)

A New Solution to Power Supply Voltage Drop Problems in Scan Testing. - Takaki Yoshida; Masafumi Watari (IEICE Trans. Inf. Syst., 2004)