Voltage-comparator-based measurement of equivalently sampled substrate noise waveforms in mixed-signal integrated circuits. - Keiko Makie-Fukuda; Takanobu Anbo; Toshiro Tsukada; Tatsuji Matsuura; Masao Hotta (IEEE J. Solid State Circuits, 1996)

Correction to "Voltage-Comparator-Based Measurement of Equivalentiy Samlpled Substrate Noise Wavefor. - Keiko Makie-Fukuda; Takanobu Anbo; Toshiro Tsukada; Tatsuji Matsuura; Masao Hotta (IEEE J. Solid State Circuits, 1996)

Substrate noise measurement by using noise-selective voltage comparators in analog and digital mixed-signal integrated circuits. - Keiko Makie-Fukuda; Takanobu Anbo; Toshiro Tsukada (IEEE Trans. Instrum. Meas., 1999)