Robust importance sampling for efficient SRAM yield analysis. - Takanori Date; Shiho Hagiwara; Kazuya Masu; Takashi Sato 001 (ISQED, 2010)

Hypersphere Sampling for Accelerating High-Dimension and Low-Failure Probability Circuit-Yield Analysis. - Shiho Hagiwara; Takanori Date; Kazuya Masu; Takashi Sato 001 (IEICE Trans. Electron., 2014)