A Method of LFSR Seed Generation for Scan-Based BIST Using Constrained ATPG. - Takanori Moriyasu; Satoshi Ohtake (CISIS, 2013)

A method of one-pass seed generation for LFSR-based deterministic/pseudo-random testing of static faults. - Takanori Moriyasu; Satoshi Ohtake (LATS, 2015)