Fair Curve and Surface Design System using Tangent Control. - Naoki Sakiyama; Kenjiro T. Miura 001; Takanori Takahashi; Toru Kaneko; Takahiro Kubo (PG, 1998)

A Nanosheet Oxide Semiconductor FET Using ALD InGaOx Channel and InSnOx Electrode with Normally-off Operation, High Mobility and Reliability for 3D Integrated Devices. - Kaito Hikake; Zhuo Li; Junxiang Hao; Chitra Pandy; Takuya Saraya; Toshiro Hiramoto; Takanori Takahashi; Mutsunori Uenuma; Yukiharu Uraoka; Masaharu Kobayashi (VLSI Technology and Circuits, 2023)

Performance and Reliability of Nanosheet Oxide Semiconductor FETs with ALD-Grown InGaO for 3D Integration (Invited). - Masaharu Kobayashi; Kaito Hikake; Zhuo Li; Junxiang Hao; Chitra Pandy; Takuya Saraya; Toshiro Hiramoto; Takanori Takahashi; Mutsunori Uenuma; Yukiharu Uraoka (IRPS, 2024)

Scaling Potential of Nanosheet Oxide Semiconductor FETs for Monolithic 3D Integration-ALD Material Engineering, High-Field Transport, Statistical Variability. - Kaito Hikake; Xingyu Huang; Sung-Hun Kim; Kota Sakai; Zhuo Li; Tomoko Mizutani; Takuya Saraya; Toshiro Hiramoto; Takanori Takahashi; Mutsunori Uenuma; Yukiharu Uraoka; Masaharu Kobayashi (VLSI Technology and Circuits, 2024)