Test Pattern Selection for Defect-Aware Test. - Yoshinobu Higami; Hiroshi Furutani; Takao Sakai; Shuichi Kameyama; Hiroshi Takahashi (Asian Test Symposium, 2011)

Hybrid method for multi-exposure image fusion based on weighted mean and sparse representation. - Takao Sakai; Daiki Kimura; Taichi Yoshida; Masahiro Iwahashi (EUSIPCO, 2015)