A Fully-Automated Electron Beam Test System for VLSI Circuits. - Norio Kuji; Teruo Tamama; Takao Yano (IEEE Des. Test, 1985)

High-Speed Digital Switching Technology Using Space-Division-Switch LSI's. - Hiroki Yamada; Hideki Kataoka; Takeshi Sampei; Takao Yano (IEEE J. Sel. Areas Commun., 1986)

Novel structure for high-speed multihighway serial-to-parallel converter. - Naoaki Yamanaka; Michihiro Hirata; Masao Suzuki; Takao Yano (IEEE Trans. Commun., 1988)

Improved digital photogrammetry technique for crack monitoring. - Satoshi Nishiyama; Nao Minakata; Teruyuki Kikuchi; Takao Yano (Adv. Eng. Informatics, 2015)