An Automatic Test Generation System for Large Scale Gate Arrays. - Takashi Aikyo; Y. Hatano; J. Ishii; N. Karasawa; S. Fujii (COMPCON, 1986)

ASIC CAD system based on hierarchical design-for-testability. - Michiaki Emori; Takashi Aikyo; Yasuhide Machida; Jun-ichi Shikatani (ITC, 1990)

ATREX : Design for Testability System for Mega Gate LSIs. - Michiaki Emori; Junko Kumagai; Koichi Itaya; Takashi Aikyo; Tomoko Anan; Junichi Niimi (Asian Test Symposium, 1997)

A Test Synthesis Approach to Reducing BALLAST DFT Overhead. - Douglas Chang; Mike Tien-Chien Lee; Malgorzata Marek-Sadowska; Takashi Aikyo; Kwang-Ting Cheng (DAC, 1997)

Issues on SOC testing in DSM area: embedded tutorial. - Takashi Aikyo (ASP-DAC, 2000)

At-Speed Testing with Timing Exceptions and Constraints-Case Studies. - Dhiraj Goswami; Kun-Han Tsai; Mark Kassab; Takeo Kobayashi; Janusz Rajski; Bruce Swanson; Darryl Walters; Yasuo Sato; Toshiharu Asaka; Takashi Aikyo (ATS, 2006)

Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects. - Xijiang Lin; Kun-Han Tsai; Chen Wang 014; Mark Kassab; Janusz Rajski; Takeo Kobayashi; Randy Klingenberg; Yasuo Sato; Shuji Hamada; Takashi Aikyo (ATS, 2006)

Effective Post-BIST Fault Diagnosis for Multiple Faults. - Hiroshi Takahashi; Shuhei Kadoyama; Yoshinobu Higami; Yuzo Takamatsu; Koji Yamazaki; Takashi Aikyo; Yasuo Sato (DFT, 2006)

Test Data Compression of 100x for Scan-Based BIST. - Masayuki Arai; Satoshi Fukumoto; Kazuhiko Iwasaki; Tatsuru Matsuo; Takahisa Hiraide; Hideaki Konishi; Michiaki Emori; Takashi Aikyo (ITC, 2006)

Clues for Modeling and Diagnosing Open Faults with Considering Adjacent Lines. - Hiroshi Takahashi; Yoshinobu Higami; Shuhei Kadoyama; Takashi Aikyo; Yuzo Takamatsu; Koji Yamazaki; Toshiyuki Tsutsumi; Hiroyuki Yotsuyanagi; Masaki Hashizume (ATS, 2007)

Test Roles in Diagnosis and Silicon Debug. - Anis Uzzaman; Fidel Muradali; Takashi Aikyo; Robert C. Aitken; Tom Jackson; Rajesh Galivanche; Takeshi Onodera (ATS, 2007)

Timing-Aware Diagnosis for Small Delay Defects. - Takashi Aikyo; Hiroshi Takahashi; Yoshinobu Higami; Junichi Ootsu; Kyohei Ono; Yuzo Takamatsu (DFT, 2007)

Test Generation and Diagnostic Test Generation for Open Faults with Considering Adjacent Lines. - Hiroshi Takahashi; Yoshinobu Higami; Toru Kikkawa; Takashi Aikyo; Yuzo Takamatsu; Hiroyuki Yotsuyanagi; Masaki Hashizume (DFT, 2007)

A Capture-Safe Test Generation Scheme for At-Speed Scan Testing. - Xiaoqing Wen; Kohei Miyase; Seiji Kajihara; Hiroshi Furukawa; Yuta Yamato; Atsushi Takashima; Kenji Noda; Hideaki Ito; Kazumi Hatayama; Takashi Aikyo; Kewal K. Saluja (ETS, 2008)

Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification. - Kohei Miyase; Kenji Noda; Hideaki Ito; Kazumi Hatayama; Takashi Aikyo; Yuta Yamato; Hiroshi Furukawa; Xiaoqing Wen; Seiji Kajihara (ICCAD, 2008)

Test Data Compression for Scan-Based BIST Aiming at 100x Compression Rate. - Masayuki Arai; Satoshi Fukumoto; Kazuhiko Iwasaki; Tatsuru Matsuo; Takahisa Hiraide; Hideaki Konishi; Michiaki Emori; Takashi Aikyo (IEICE Trans. Inf. Syst., 2008)

Post-BIST Fault Diagnosis for Multiple Faults. - Hiroshi Takahashi; Yoshinobu Higami; Shuhei Kadoyama; Yuzo Takamatsu; Koji Yamazaki; Takashi Aikyo; Yasuo Sato (IEICE Trans. Inf. Syst., 2008)

Fault Diagnosis on Multiple Fault Models by Using Pass/Fail Information. - Yuzo Takamatsu; Hiroshi Takahashi; Yoshinobu Higami; Takashi Aikyo; Koji Yamazaki (IEICE Trans. Inf. Syst., 2008)

Estimation of Delay Test Quality and Its Application to Test Generation. - Seiji Kajihara; Shohei Morishima; Masahiro Yamamoto; Xiaoqing Wen; Masayasu Fukunaga; Kazumi Hatayama; Takashi Aikyo (IPSJ Trans. Syst. LSI Des. Methodol., 2008)

An Adaptive Test for Parametric Faults Based on Statistical Timing Information. - Michihiro Shintani; Takumi Uezono; Tomoyuki Takahashi; Hiroyuki Ueyama; Takashi Sato 001; Kazumi Hatayama; Takashi Aikyo; Kazuya Masu (Asian Test Symposium, 2009)

A novel post-ATPG IR-drop reduction scheme for at-speed scan testing in broadcast-scan-based test compression environment. - Kohei Miyase; Yuta Yamato; Kenji Noda; Hideaki Ito; Kazumi Hatayama; Takashi Aikyo; Xiaoqing Wen; Seiji Kajihara (ICCAD, 2009)

Diagnostic test generation for transition faults using a stuck-at ATPG tool. - Yoshinobu Higami; Yosuke Kurose; Satoshi Ohno; Hironori Yamaoka; Hiroshi Takahashi; Yoshihiro Shimizu; Takashi Aikyo; Yuzo Takamatsu (ITC, 2009)

A Novel Approach for Improving the Quality of Open Fault Diagnosis. - Koji Yamazaki; Toshiyuki Tsutsumi; Hiroshi Takahashi; Yoshinobu Higami; Takashi Aikyo; Yuzo Takamatsu; Hiroyuki Yotsuyanagi; Masaki Hashizume (VLSI Design, 2009)

Fault Effect of Open Faults Considering Adjacent Signal Lines in a 90 nm IC. - Hiroyuki Yotsuyanagi; Masaki Hashizume; Toshiyuki Tsutsumi; Koji Yamazaki; Takashi Aikyo; Yoshinobu Higami; Hiroshi Takahashi; Yuzo Takamatsu (VLSI Design, 2009)

Small Delay Fault Model for Intra-Gate Resistive Open Defects. - Masayuki Arai; Akifumi Suto; Kazuhiko Iwasaki; Katsuyuki Nakano; Michihiro Shintani; Kazumi Hatayama; Takashi Aikyo (VTS, 2009)

Test Challenge for Deep Sub-micron Era - Test & Diagnosis Platform: STARCAD-Clouseau. - Takashi Aikyo (DFT, 2010)

A Study of Capture-Safe Test Generation Flow for At-Speed Testing. - Kohei Miyase; Xiaoqing Wen; Seiji Kajihara; Yuta Yamato; Atsushi Takashima; Hiroshi Furukawa; Kenji Noda; Hideaki Ito; Kazumi Hatayama; Takashi Aikyo; Kewal K. Saluja (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2010)

Distribution-Controlled X-Identification for Effective Reduction of Launch-Induced IR-Drop in At-Speed Scan Testing. - Kohei Miyase; Kenji Noda; Hideaki Ito; Kazumi Hatayama; Takashi Aikyo; Yuta Yamato; Hiroshi Furukawa; Xiaoqing Wen; Seiji Kajihara (IEICE Trans. Inf. Syst., 2011)

Generation of Diagnostic Tests for Transition Faults Using a Stuck-At ATPG Tool. - Yoshinobu Higami; Satoshi Ohno; Hironori Yamaoka; Hiroshi Takahashi; Yoshihiro Shimizu; Takashi Aikyo (IEICE Trans. Inf. Syst., 2012)

A Variability-Aware Adaptive Test Flow for Test Quality Improvement. - Michihiro Shintani; Takumi Uezono; Tomoyuki Takahashi; Kazumi Hatayama; Takashi Aikyo; Kazuya Masu; Takashi Sato 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014)